Nanometrology

Nanometrology involves the measurement of geometrical features of size, shape and roughness at the nanoscale. A nanometrology infrastructure is also a prerequisite for documentary standards and regulations involving nanotechnology, which to be effective must be written in terms of measurable quantities and levels, tolerances and uncertainties, incorporating reliable measurement instruments and techniques. The aim is to advance the boundaries of knowledge in instrumentation and metrology and to bring state-of-the-art tools and techniques to bear in the development of standards for the nanotechnology community. Some of the most common techniques used in nanometrology are atomic force microscopy, electron microscopy and X-ray diffraction. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing.

  • Manufacturing
  • Nanotechnology
  • Surface finishing
  • Calibration
  • Geometrical optics

Related Conference of Nanometrology

September 22-23, 2025

35th World Nano Conference

Dubai, UAE
October 21-22, 2025

42nd Global Summit on Nanoscience and Technology

London, UK
November 27-28, 2025

33rd International Conference on Nanomedicine & Drug Delivery

Aix-en-Provence, France
December 22-23, 2025

42nd Global Nanotechnology Congress

Amsterdam, Netherlands

Nanometrology Conference Speakers

    Recommended Sessions

    Related Journals

    Are you interested in