Nanometrology

Nanometrology involves the measurement of geometrical features of size, shape and roughness at the nanoscale. A nanometrology infrastructure is also a prerequisite for documentary standards and regulations involving nanotechnology, which to be effective must be written in terms of measurable quantities and levels, tolerances and uncertainties, incorporating reliable measurement instruments and techniques. The aim is to advance the boundaries of knowledge in instrumentation and metrology and to bring state-of-the-art tools and techniques to bear in the development of standards for the nanotechnology community. Some of the most common techniques used in nanometrology are atomic force microscopy, electron microscopy and X-ray diffraction. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing. Nanometrology has a crucial role in order to produce nanomaterials and devices with a high degree of accuracy and reliability in nanomanufacturing.

  • Manufacturing
  • Nanotechnology
  • Surface finishing
  • Calibration
  • Geometrical optics

Related Conference of Nanometrology

October 15-17, 2018

21st World Nanotechnology Congress

Dubai, UAE
November 02-03, 2018

2nd International Conference on Nanostructured Materials & Nanochemistry

San Francisco | California | USA
November 26-28, 2018

3rd World Congress and Expo on Graphene & 2D Materials

Barcelona, Spain
May 20-21, 2019

30th World Nano Conference

Z├╝rich, Switzerland
March 21-22, 2019

24th Annual Meeting on Nanomaterials Science


New York | USA
Mar 25-26, 2019

21st Asia Pacific Nanotechnology Congress

Yokohama, Japan
August 29-31, 2019

31st Nano Congress for Future Advancements

London, UK
October 10-11, 2019

32nd International Conference on Advanced Nanotechnology

Dublin, Ireland

Nanometrology Conference Speakers

Recommended Sessions

Related Journals

Are you interested in